US 12,422,353 B2
Devices, systems, and methods for analyzing measurement objects
Kotaro Ishizaki, Zurich (CH); and Agata Dorota Ishizaki-Sroka, Zurich (CH)
Assigned to Aikemy GmbH, Zurich (CH)
Filed by Aikemy Gmbh, Zurich (CH)
Filed on Nov. 30, 2022, as Appl. No. 18/071,690.
Claims priority of provisional application 63/291,463, filed on Dec. 20, 2021.
Prior Publication US 2024/0175807 A1, May 30, 2024
Int. Cl. G01N 21/27 (2006.01); G01J 3/02 (2006.01); G01J 3/28 (2006.01); G01J 3/36 (2006.01); G01J 3/42 (2006.01)
CPC G01N 21/274 (2013.01) [G01J 3/0256 (2013.01); G01J 3/027 (2013.01); G01J 3/0294 (2013.01); G01J 3/0297 (2013.01); G01J 3/28 (2013.01); G01J 3/36 (2013.01); G01J 3/42 (2013.01); G01J 3/0272 (2013.01); G01N 2201/121 (2013.01)] 23 Claims
OG exemplary drawing
 
1. A device for analyzing a sample comprising:
a measurement area at which the sample is to be located;
an illumination arrangement including at least one illumination source for illuminating the measurement area with illumination such that the illumination is incident on the sample; and
a spectral sensing arrangement including:
a first spectral sensor configured to perform a spectral measurement of the sample during a measurement period in response to the incident illumination so as to produce spectral measurement data, and a
second spectral sensor configured to measure background noise that arises from changing measurement conditions during the measurement period so as to produce background measurement data that provides at least a partial correction for noise in the spectral measurement data,
wherein the spectral sensing arrangement is deployed such that each of the first and second spectral sensors is oriented toward the measurement area so as to collect illumination arriving from the measurement area;
wherein the first spectral sensor is configured to perform the spectral measurement of the sample during the measurement period by applying a wavelength-dependent voltage sweep while collecting the illumination arriving from the measurement area, and where in the second spectral sensor is configured to measure the background noise that arises from changing measurement conditions during the measurement period during the measurement period by applying a constant voltage corresponding to a specific wavelength while collecting the illumination arriving from the measurement area.