US 12,422,301 B2
Infrared emitter checking circuit and method
Daniel J. Declerck, Milford, MI (US); and Phillip Eric McGee, White Lake Township, MI (US)
Assigned to Harman International Industries, Incorporated, Stamford, CT (US)
Filed by Harman International Industries, Incorporated, Stamford, CT (US)
Filed on Sep. 1, 2023, as Appl. No. 18/241,672.
Prior Publication US 2025/0076109 A1, Mar. 6, 2025
Int. Cl. G01J 1/44 (2006.01); H03K 3/037 (2006.01)
CPC G01J 1/44 (2013.01) [H03K 3/037 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An apparatus comprising:
a measurement circuit configured to receive an input signal from a transmitting source and to provide an averaged input signal based on the input signal; and
a trigger determination circuit configured to:
receive the averaged input signal;
compare the averaged input signal to a predetermined threshold; and
provide a first output indicative of the averaged input signal exceeding the predetermined threshold; and
a latch circuit configured to:
receive the first output; and
trigger a latch condition to prevent the transmitting source from transmitting the input signal in response to the first output.