US D1,042,346 S
Contact pin for integrated circuit testing
Melissa Hasskamp, Minneapolis, MN (US); David Skodje, Minneapolis, MN (US); and Mike Andres, Inver Grove Heights, MN (US)
Assigned to Johnstech International Corporation, Minneapolis, MN (US)
Filed by Johnstech International Corporation, Minneapolis, MN (US)
Filed on Jun. 17, 2022, as Appl. No. 29/843,097.
Application 29/843,097 is a continuation in part of application No. 29/833,520, filed on Apr. 5, 2022.
Term of patent 15 Years
LOC (14) Cl. 13 - 03
U.S. Cl. D13—154
OG exemplary drawing
 
The ornamental design for a contact pin for integrated circuit testing, as shown and described.