US 12,093,161 B2
Debug trace fabric for integrated circuit
Charles J. Fleckenstein, Portland, OR (US); Ori Isachar, Herzliya (IL); and Tal Lazmi, Herzliya (IL)
Assigned to Apple Inc., Cupertino, CA (US)
Filed by Apple Inc., Cupertino, CA (US)
Filed on May 20, 2021, as Appl. No. 17/326,114.
Prior Publication US 2022/0374326 A1, Nov. 24, 2022
Int. Cl. G06F 11/30 (2006.01); G01R 31/317 (2006.01); G06F 11/34 (2006.01); G06F 13/40 (2006.01)
CPC G06F 11/348 (2013.01) [G01R 31/31705 (2013.01); G06F 11/3003 (2013.01); G06F 11/3065 (2013.01); G06F 11/3485 (2013.01); G06F 11/349 (2013.01); G06F 11/3495 (2013.01); G06F 13/4022 (2013.01); G06F 13/4027 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An apparatus comprising:
a computer system, wherein the computer system includes:
at least one functional network that includes a plurality of component circuits interconnected by ones of a plurality of functional network switches, wherein ones of the plurality of component circuits are configured to convey transactional traffic between each other, and
a trace network configured to convey trace data that is based on the transactional traffic and includes metadata that is distinct from the transactional traffic, wherein the trace data enables performance of debug operations of the computer system, and wherein the trace network includes:
a plurality of trace circuits configured to generate the trace data; and
a plurality of trace network switches, wherein ones of the plurality of trace circuits are interconnected by ones of the plurality of trace network switches, wherein ones of the plurality of trace circuits are configured to convey the trace data to a debug interface via the trace network without using the at least one functional network.