US 12,092,808 B2
Self-calibrating and directional focusing systems and methods for infinity corrected microscopes
Matthew Chan, San Jose, CA (US)
Assigned to Molecular Devices, LLC, San Jose, CA (US)
Filed by Molecular Devices, LLC, San Jose, CA (US)
Filed on Apr. 7, 2023, as Appl. No. 18/132,273.
Application 18/132,273 is a continuation of application No. 17/368,545, filed on Jul. 6, 2021, granted, now 11,624,901.
Application 17/368,545 is a continuation of application No. 16/397,665, filed on Apr. 29, 2019, granted, now 11,086,118, issued on Aug. 10, 2021.
Prior Publication US 2023/0359013 A1, Nov. 9, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G02B 21/24 (2006.01); G02B 7/09 (2021.01)
CPC G02B 21/245 (2013.01) [G02B 7/09 (2013.01)] 23 Claims
OG exemplary drawing
 
1. A system for autofocusing an objective lens in a microscope system comprising:
a light source;
an objective lens positionable at a plurality of z-positions along an axis of travel of the objective lens;
an image capturing device;
a decentered aperture spaced from the light source and disposed in an optical path between the light source and the objective lens, wherein the decentered aperture in combination with movement of the objective lens causes a position of a pattern formed on the image plane to vary in accordance with a change in a z-position of the objective lens; and
a controller that undertakes an autofocus calibration process that includes:
causing the objective lens to move along the axis of travel,
operating the image capturing device to capture a plurality of reference images of a pattern reflected from a reference surface, wherein each reference image is captured when the objective lens is positioned at a corresponding z-position of the plurality of z-positions along the axis of travel,
analyzing the plurality of reference images to develop a plurality of pattern locations, wherein each pattern location represents a position of the pattern formed on the image plane when a corresponding reference image was captured, and wherein at least one reference image of the plurality of reference images is associated with a best focus position, and
positioning the objective lens in accordance with the best focus position and the plurality of pattern locations.