US 12,092,754 B2
Detection or correction for multipath reflection
Bo Li, Pittsburgh, PA (US); James Curry, Bozeman, MT (US); and Shaogang Wang, Pittsburgh, PA (US)
Assigned to Aurora Operations, Inc, Pittsburgh, PA (US)
Filed by Aurora Innovation, Inc., Palo Alto, CA (US)
Filed on Apr. 13, 2021, as Appl. No. 17/229,338.
Prior Publication US 2022/0326343 A1, Oct. 13, 2022
Int. Cl. G01S 7/02 (2006.01); G01S 7/48 (2006.01); G01S 13/86 (2006.01); G01S 13/931 (2020.01)
CPC G01S 7/021 (2013.01) [G01S 7/4804 (2013.01); G01S 13/865 (2013.01); G01S 13/931 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method comprising:
obtaining a location of a first sensor point that represents a location of an image of an object, wherein the first sensor point is associated with a mirror image of the object across a surface plane;
determining that the first sensor point is a product of multipath reflection using a surface model;
determining a first point of reflection on a surface of the surface model; and
correcting the location of the first sensor point based on the first point of reflection on the surface of the surface model, wherein correcting the location of the first sensor point includes:
determining a surface plane at the first point of reflection on the surface of the surface model at least in part by:
querying a neighborhood of the first point of reflection on the surface of the surface model;
computing a normal associated with the surface plane based on the neighborhood of the first point of reflection on the surface of the surface model, wherein the surface plane is based on the computed normal; and
mirroring the first sensor point across the surface plane at the first point of reflection to represent the location of the object.