US 12,092,689 B2
Scan test in a single-wire bus circuit
Alexander Wayne Hietala, Phoenix, AZ (US); Christopher Truong Ngo, Queen Creek, AZ (US); and Ryan Lee Bunch, Colfax, NC (US)
Assigned to Qorvo US, Inc., Greensboro, NC (US)
Filed by Qorvo US, Inc., Greensboro, NC (US)
Filed on Dec. 8, 2021, as Appl. No. 17/545,113.
Prior Publication US 2023/0176120 A1, Jun. 8, 2023
Int. Cl. G01R 31/3177 (2006.01); G01R 31/28 (2006.01); G01R 31/317 (2006.01); G01R 31/3185 (2006.01); G01R 31/3187 (2006.01); G11C 29/32 (2006.01); G11C 29/56 (2006.01)
CPC G01R 31/3177 (2013.01) [G01R 31/2851 (2013.01); G01R 31/2884 (2013.01); G01R 31/31712 (2013.01); G01R 31/31713 (2013.01); G01R 31/31724 (2013.01); G01R 31/318572 (2013.01); G01R 31/3187 (2013.01); G11C 29/32 (2013.01); G11C 2029/5602 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A single-wire bus circuit comprising:
a bus pin coupled to a single-wire bus;
a communication circuit coupled to the bus pin during a communication mode to carry out normal communications over the single-wire bus and decoupled from the bus pin during a test mode to undergo a test; and
a driver circuit coupled to the bus pin during the test mode and decoupled from the bus pin during the communication mode and comprising:
a plurality of test pins coupled to the communication circuit; and
a test driver circuit configured to operate in the test mode in each of a plurality of test cycles to:
provide one or more test input values to a first subset of the plurality of test pins to thereby cause the test to be performed in the communication circuit; and
receive one or more test output values resulting from the test performed in the communication circuit via a second subset of the plurality of test pins; and
a master circuit coupled to the bus pin via the single-wire bus and configured to communicate a test initiation command to the communication circuit during the communication mode to thereby instruct the communication circuit to switch from the communication mode to the test mode.