US 12,092,686 B2
Apparatus and method for electrically coupling a unit under test with a debugging component
Aleksandr Dean Schwerdt, Rowland Heights, CA (US); Daniel Roy Ostrander, Lake Forest, CA (US); David Alexander Jachmann, Corona, CA (US); Lynn Charles Berning, Rochester, MN (US); Robert Joseph Harvey, Rowland Heights, CA (US); Eric Lee Severtson, San Clemente, CA (US); and Curtis Adam Harper, Berthoud, CO (US)
Assigned to Western Digital Technologies, Inc., San Jose, CA (US)
Filed by Western Digital Technologies, Inc., San Jose, CA (US)
Filed on Dec. 14, 2021, as Appl. No. 17/550,682.
Prior Publication US 2023/0184829 A1, Jun. 15, 2023
Int. Cl. G01R 31/317 (2006.01)
CPC G01R 31/31713 (2013.01) [G01R 31/31705 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An apparatus for electrically coupling an electrical interface of a unit under test with a debugging component, the apparatus comprising:
a bracket assembly comprising a socket configured to electrically couple with the electrical interface;
a baseplate assembly having a plate, and configured to secure the unit under test on the plate;
a crane assembly coupled to the bracket assembly and configured to:
enable movement of the socket relative to the electrical interface in each of a horizontal direction, a vertical direction, and an angular direction; and
secure the socket in place relative to the electrical interface by applying a force by the socket against the electrical interface; and
a cable assembly configured to electrically couple with the socket at a first end and with the debugging component at a second end.