US 12,092,608 B2
Ion analysis device
Hidenori Takahashi, Kyoto (JP)
Assigned to SHIMADZU CORPORATION, Kyoto (JP)
Appl. No. 17/792,170
Filed by SHIMADZU CORPORATION, Kyoto (JP)
PCT Filed Mar. 12, 2020, PCT No. PCT/JP2020/010915
§ 371(c)(1), (2) Date Jul. 12, 2022,
PCT Pub. No. WO2021/181628, PCT Pub. Date Sep. 16, 2021.
Prior Publication US 2023/0048972 A1, Feb. 16, 2023
Int. Cl. H01J 49/14 (2006.01); G01N 27/623 (2021.01); G01N 27/626 (2021.01)
CPC G01N 27/623 (2021.01) [G01N 27/626 (2013.01); H01J 49/14 (2013.01)] 10 Claims
OG exemplary drawing
 
1. An ion analysis device configured to generate and analyze product ions from precursor ions derived from a sample component, the ion analysis device comprising:
a reaction chamber into which the precursor ions are introduced;
a radical emitter made of a predetermined kind of metal and disposed in the reaction chamber or a space communicating with the reaction chamber, at least a part of a surface of the radical emitter being oxidized or nitrided;
a heating unit configured to heat the radical emitter to a predetermined temperature; and
a separation detection unit configured to separate and detect, according to at least one of a mass-to-charge ratio and an ion mobility, product ions generated from the precursor ions by a reaction with radicals emitted from the radical emitter heated to the predetermined temperature.