US 12,092,600 B2
Resistivity imaging system with compensator for parasitic impedances between electrodes and their conductive substrates
Michael William Hopkins, Hampshire (GB); Rajinder Singh, Berkshire (GB); and Lyn David Jones, Hampshire (GB)
Assigned to QinetiQ Limited, Hampshire (GB)
Appl. No. 17/757,128
Filed by QinetiQ Limited, Hampshire (GB)
PCT Filed Dec. 17, 2020, PCT No. PCT/GB2020/000105
§ 371(c)(1), (2) Date Jun. 9, 2022,
PCT Pub. No. WO2021/123704, PCT Pub. Date Jun. 24, 2021.
Claims priority of application No. 1918713 (GB), filed on Dec. 18, 2019.
Prior Publication US 2023/0003677 A1, Jan. 5, 2023
Int. Cl. G01N 27/22 (2006.01); G01V 3/22 (2006.01); G01V 3/24 (2006.01); E21B 47/002 (2012.01)
CPC G01N 27/228 (2013.01) [G01V 3/22 (2013.01); G01V 3/24 (2013.01); E21B 47/0025 (2020.05)] 16 Claims
OG exemplary drawing
 
1. An imaging system for imaging of materials, comprising of:
a plurality of conductive electrodes positionable in an environment to be imaged;
a signal generator connected to at least two of the electrodes; and
a signal detector connected to at least two of the electrodes, wherein the electrodes are supported on one or more conductive substrates;
characterised in that it further comprises an impedance compensator arranged to counter parasitic impedance between each electrode and its substrate, wherein the impedance compensator comprises a negative impedance, wherein the negative impedance is arranged to cancel or reduce a parasitic impedance between a drive electrode and a conductive support.