CPC G01N 23/223 (2013.01) [G01B 15/02 (2013.01); G01N 2223/076 (2013.01); G01N 2223/507 (2013.01); G01N 2223/61 (2013.01); G01N 2223/633 (2013.01)] | 16 Claims |
1. A method for measuring an average thickness of a metal coating or an alloy coating on a metal substrate or an alloy substrate using an X-ray fluorescence (XRF) spectrometer, wherein the metal coating or the alloy coating has an uneven surface with substantially different distances from a measurement window of the X-ray fluorescence spectrometer, the method comprising:
measuring an elemental composition of the metal coating, the alloy coating, the metal substrate, or the alloy substrate using the X-ray fluorescence (XRF) spectrometer; and
obtaining the average thickness of the metal coating or the alloy coating using a calibration relationship between a metal coating thickness or an alloy coating thickness and an elemental composition of the metal coating, the alloy coating, the metal substrate, or the alloy substrate.
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