US 12,092,567 B2
Optical detection system calibration
Francesco Paolo D'Aleo, Zurich (CH); Javier Miguel Sánchez, Zurich (CH); Kotaro Ishizaki, Zurich (CH); and Peter Roentgen, Thalwil (CH)
Assigned to AMS Sensors Singapore Pte. Ltd., Singapore (SG)
Appl. No. 17/762,456
Filed by ams Sensors Singapore Pte. Ltd., Singapore (SG)
PCT Filed May 24, 2021, PCT No. PCT/SG2021/050281
§ 371(c)(1), (2) Date Mar. 22, 2022,
PCT Pub. No. WO2021/262088, PCT Pub. Date Dec. 30, 2021.
Claims priority of application No. 2009640 (GB), filed on Jun. 24, 2020.
Prior Publication US 2022/0373454 A1, Nov. 24, 2022
Int. Cl. G01N 21/27 (2006.01); G01N 21/55 (2014.01)
CPC G01N 21/274 (2013.01) [G01N 21/55 (2013.01); G01N 2201/127 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A method of measuring an optical reflectance R of a target using a detection system comprising a light emitter and a light detector spaced apart from one another, the method comprising:
illuminating the target with the light emitter;
detecting light reflected from the target using the light detector, wherein the light detector provides an electrical output signal SS indicative of the intensity of the detected light; and
determining the optical reflectance R of the target according to

OG Complex Work Unit Math
where
RR is the spectral reflectance of a reference standard,
SR is the detector electrical output signal with the reference standard in place,
SH is the detector electrical output signal with no target in front of the light emitter and light detector, and
M is a calibration factor.