US 12,092,518 B2
High power laser profiler
Leo R. Gauthier, Jr., Ellicott City, MD (US); and Kenneth W. Harclerode, Pasadena, MD (US)
Assigned to The Johns Hopkins University, Baltimore, MD (US)
Filed by The Johns Hopkins University, Baltimore, MD (US)
Filed on Feb. 19, 2022, as Appl. No. 17/676,119.
Claims priority of provisional application 63/176,428, filed on Apr. 19, 2021.
Prior Publication US 2022/0333982 A1, Oct. 20, 2022
Int. Cl. G02B 21/06 (2006.01); G01J 1/42 (2006.01); H01S 3/00 (2006.01)
CPC G01J 1/4257 (2013.01) [G02B 21/06 (2013.01); H01S 3/0014 (2013.01); G01J 2001/4261 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A system comprising:
a plate comprising protrusions, wherein the protrusions are configured to receive a radiation beam emitted by a light source and have a predetermined diameter and are spaced apart such that heat travels along a respective length of each of the protrusions without affecting heat in another one of the protrusions; and
a first detector comprising a radiance imaging device, wherein the first detector is configured to measure a respective temperature of each of the protrusions.