US 12,417,189 B2
Automated damage condition detection and data backup in an electronic device
Hari Krishna Munagala, Giddalur (IN); Ravinder Are, Hyderabad (IN); Rajeevalochana R, Hyderabad (IN); Utkarsh Verma, Lucknow (IN); Praveen Kandukuri, Chilakaluripet (IN); and Hargovind Prasad Bansal, Bharatpur (IN)
Assigned to Qualcomm Incorporated, San Diego, CA (US)
Filed by QUALCOMM Incorporated, San Diego, CA (US)
Filed on Oct. 23, 2023, as Appl. No. 18/492,101.
Prior Publication US 2025/0130957 A1, Apr. 24, 2025
Int. Cl. G06F 12/14 (2006.01); G06F 11/14 (2006.01); G06F 12/02 (2006.01)
CPC G06F 12/1425 (2013.01) [G06F 11/1451 (2013.01); G06F 12/0246 (2013.01)] 30 Claims
OG exemplary drawing
 
1. An apparatus, comprising:
at least one memory; and
at least one processor coupled to the memory, wherein the at least one processor is configured to perform operations comprising:
detecting a potential damage condition for the apparatus;
waking one or more islands of the apparatus from a sleep state in response to detection of the potential damage condition for the apparatus prior to performing a data backup; and
in response to detection of the potential damage condition for the apparatus, performing, using the one or more islands of the apparatus, the data backup of data stored in the at least one memory of the apparatus to a remote data storage device or to a flash memory of the apparatus based on a type of the potential damage condition.