CPC H02P 21/0003 (2013.01) [H02P 27/06 (2013.01)] | 20 Claims |
1. A test and measurement device, comprising:
an interface configured to acquire time-varying analog three-phase signals from a device under test, the device under test including a rotor rotating with respect to a stator when the analog three-phase signals are acquired;
a processor programmed to execute instructions that cause the processor to:
perform a direct-quadrature-zero, DQ0, transformation and produce DQ0 signals based on the analog three-phase signals, wherein the DQ0 transformation is performed for every sample point of the acquired analog three-phase signals; and
measure performance of the device under test based on the DQ0 signals; and
a display, wherein the processor is programmed to execute instructions that cause the processor to generate a phasor diagram using the DQ0 signals, and to display the phasor diagram on the display;
wherein the processor is programmed to execute instructions that cause the processor to update the phasor diagram on the display over time, for every sample point of the acquired analog three-phase signals as the analog three-phase signals are acquired.
|