US 12,087,031 B2
Method and device for analyzing plants
Ben Niehaus, Dresden (DE)
Assigned to SPEXAI GMBH, Dresden (DE)
Appl. No. 17/426,427
Filed by SpexAI GmbH, Dresden (DE)
PCT Filed Feb. 5, 2020, PCT No. PCT/EP2020/052840
§ 371(c)(1), (2) Date Jul. 28, 2021,
PCT Pub. No. WO2020/161176, PCT Pub. Date Aug. 13, 2020.
Claims priority of application No. 19155791 (EP), filed on Feb. 6, 2019.
Prior Publication US 2022/0108543 A1, Apr. 7, 2022
Int. Cl. G06V 10/58 (2022.01); G06N 3/08 (2023.01); G06V 10/141 (2022.01); G06V 10/147 (2022.01); G06V 20/10 (2022.01)
CPC G06V 10/58 (2022.01) [G06N 3/08 (2013.01); G06V 10/141 (2022.01); G06V 10/147 (2022.01); G06V 20/188 (2022.01)] 7 Claims
OG exemplary drawing
 
1. A method for analyzing a plant using an illumination unit, a sensor unit and an evaluation unit, wherein the evaluation unit comprises a data-based classifier and the method comprises the following steps:
training the classifier, the training comprising the following steps:
illuminating a training plant having at least one known property using the illumination unit;
acquiring training input data by measuring the radiation reflected from the training plant;
training of the classifier with the acquired training input data, as well as training output data, wherein the training input data at least comprises spectral information, including an absorption spectrum or a reflection spectrum of the training plant, and the training output data is associated to the training input data and comprise information about at least one property of the training plant;
acquiring analysis input data by means of the sensor unit, wherein the acquiring comprises the following steps:
illuminating a plant to be analyzed which has at least one unknown property, using the illumination unit;
acquiring analysis input data by measuring the radiation reflected from the plant to be analyzed;
determining a property of the plant to be analyzed, using the classifier previously trained with the trainings input data and the training output data and the acquired analysis input data,
wherein
the steps of illuminating a training plant having at least one known property using the illumination unit and acquiring training input data by measuring the radiation reflected from the training plant, comprises:
illuminating the training plant using a first light source having a first emission spectrum;
acquiring training input data by measuring the radiation reflected from the training plant;
illuminating the training plant with a second light source having a second emission spectrum; and
acquiring training input data by measuring the radiation reflected from the training plant, and wherein
the steps of illuminating a plant to be analyzed having at least one unknown property using the illumination unit and acquiring analysis input data by measuring the radiation reflected from the plant to be analyzed include the following steps:
illuminating the plant to be analyzed using a first light source having a first emission spectrum;
acquiring analysis input data by measuring the radiation reflected from the plant being analyzed;
illuminating the plant to be analyzed with a second light source having a second emission spectrum; and
acquiring analysis input data by measuring the radiation reflected from the plant being analyzed.