US 12,086,520 B2
System and method for multi-material mesh generation from fill-fraction voxel data
Daniel Sieger, Épinay sur Orge (FR); Kenneth B. Greiner, Arlington, MA (US); Daniel Faken, Peabody, MA (US); Vincent Baudet, La Mulatiere (FR); and Stéphane Calderon, Saint Rémy les Chevreuse (FR)
Assigned to Coventor, Inc., Cary, NC (US)
Appl. No. 16/968,856
Filed by Coventor, Inc., Cary, NC (US)
PCT Filed Feb. 15, 2019, PCT No. PCT/US2019/018237
§ 371(c)(1), (2) Date Aug. 10, 2020,
PCT Pub. No. WO2019/161218, PCT Pub. Date Aug. 22, 2019.
Claims priority of provisional application 62/710,335, filed on Feb. 16, 2018.
Prior Publication US 2021/0012049 A1, Jan. 14, 2021
Int. Cl. G06F 30/3308 (2020.01); G06F 30/23 (2020.01); G06F 111/08 (2020.01); G06F 111/10 (2020.01)
CPC G06F 30/3308 (2020.01) [G06F 30/23 (2020.01); G06F 2111/08 (2020.01); G06F 2111/10 (2020.01)] 23 Claims
OG exemplary drawing
 
1. A non-transitory medium holding computer-executable instructions for performing multi-material mesh generation in a virtual fabrication environment, the instructions when executed causing at least one computing device to:
receive, in the virtual fabrication environment, fill-fraction voxel model data of a semiconductor device as an input domain;
create, in the virtual fabrication environment, an initial feature graph using the fill-fraction voxel model data;
process the initial feature graph to generate a feature graph, wherein the initial feature graph is of higher resolution than the feature graph, wherein generating the feature graph comprises repairing the initial feature graph and performing a re-sampling of the initial feature graph based on a desired edge length for points on the initial feature graph, and wherein the feature graph satisfies criteria for an input for Delaunay triangulation; and
generate, in the virtual fabrication environment, a multi-material mesh for the semiconductor device, the generating of the multi-material mesh performing the Delaunay triangulation using the feature graph and material identifiers from the fill-fraction voxel model data.