US 12,085,613 B2
Systems and methods for storing calibration data of a test system for testing a device under test
Shoji Kojima, Sindelfingen (DE)
Assigned to Advantest Corporation, Tokyo (JP)
Filed by Advantest Corporation, Tokyo (JP)
Filed on Apr. 29, 2022, as Appl. No. 17/733,805.
Application 17/733,805 is a continuation of application No. PCT/EP2020/065564, filed on Jun. 4, 2020.
Prior Publication US 2022/0260633 A1, Aug. 18, 2022
Int. Cl. G01R 31/319 (2006.01)
CPC G01R 31/3191 (2013.01) 20 Claims
OG exemplary drawing
 
1. A method of storing calibration data of a test system, the method comprising:
storing first calibration information of the calibration data on a first non-volatile memory, wherein the test system comprises a plurality of channel modules and a device interface, wherein the plurality of channel modules comprise an embedded processor and the first non-volatile memory, and wherein the test system is operable to test a device under test (DUT); and
storing second calibration information of the calibration data on a second non-volatile memory associated with the device interface,
wherein the first calibration information is associated with the plurality of channel modules of the test system, and
wherein the second calibration information is associated with the device interface of the test system.