US 12,085,611 B2
Applications of adaptive microelectronic circuits that are designed for testability
Lauri Koskinen, Helsinki (FI); Navneet Gupta, Oulu (FI); and Jesse Simonsson, Jorvas (FI)
Assigned to Minima Processor Oy, Oulu (FI)
Appl. No. 17/285,614
Filed by Minima Processor Oy, Oulu (FI)
PCT Filed Oct. 16, 2018, PCT No. PCT/FI2018/050753
§ 371(c)(1), (2) Date Apr. 15, 2021,
PCT Pub. No. WO2020/079321, PCT Pub. Date Apr. 23, 2020.
Prior Publication US 2021/0318377 A1, Oct. 14, 2021
Int. Cl. G01R 31/3177 (2006.01); G01R 31/317 (2006.01); G01R 31/3173 (2006.01)
CPC G01R 31/3177 (2013.01) [G01R 31/31712 (2013.01); G01R 31/31725 (2013.01); G01R 31/3173 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A method for operating an adaptive microelectronic circuit, performance of which is configurable through making an operating parameter assume an operating parameter value, the method comprising:
selectively setting the microelectronic circuit into a test mode that differs from a normal operating mode of the microelectronic circuit,
utilizing said test mode to input test input signals consisting of test input values into one or more adaptive processing paths within the microelectronic circuit, wherein an adaptive processing path comprises processing logic and register circuits configured to produce output values from input values input to them, and wherein the performance of such an adaptive processing path can be configured by making an operating parameter assume an operating parameter value,
making said one or more adaptive processing paths form test output values on the basis of the respective test input values input to them, and forming a set of test output signals by collecting said test output values given by said one or more adaptive processing paths,
examining said set of test output signals, and forming a test result on the basis of said examining, and
using said test result to select and set an operating parameter value for said operating parameter.