US 12,085,601 B2
Systems and methods to monitor leakage current
Romeo Letor, Mascalucia (IT); and Veronica Puntorieri, San Giovanni la Punta (IT)
Assigned to STMicroelectronics S.r.l., Agrate Brianza (IT)
Filed by STMicroelectronics S.r.l., Agrate Brianza (IT)
Filed on Jan. 4, 2022, as Appl. No. 17/568,278.
Prior Publication US 2023/0213574 A1, Jul. 6, 2023
Int. Cl. G01R 31/26 (2020.01); G01R 19/165 (2006.01); G01R 19/32 (2006.01); G01R 31/28 (2006.01)
CPC G01R 31/2642 (2013.01) [G01R 19/16528 (2013.01); G01R 19/32 (2013.01); G01R 31/2831 (2013.01); G01R 31/2884 (2013.01); G01R 31/2886 (2013.01); H01L 2924/00 (2013.01); H01L 2924/0002 (2013.01); H01L 2924/14 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system to monitor a MOSFET, the system comprising:
a switching circuit comprising
a first switch disposed between a gate terminal of the MOSFET and a gate driver to switchably isolate the gate terminal of the MOSFET from a gate-control voltage source, and
a second switch disposed between a source terminal of the MOSFET and the gate driver to switchably isolate the source terminal from the gate-control voltage source; and
a test circuit configured to detect a change in a gate-to-source voltage of the MOSFET over a test period, the test period occurring while the gate terminal and the source terminal are isolated.