US 12,085,582 B2
Automatic analysis device, automatic analysis system, and automatic analysis method for analytes
Tsukasa Suenari, Tokyo (JP); Masashi Akutsu, Tokyo (JP); Hiroyuki Mishima, Tokyo (JP); Takeshi Setomaru, Tokyo (JP); and Akihiro Yasui, Tokyo (JP)
Assigned to HITACHI HIGH-TECH CORPORATION, Tokyo (JP)
Appl. No. 17/284,763
Filed by HITACHI HIGH-TECH CORPORATION, Tokyo (JP)
PCT Filed Dec. 2, 2019, PCT No. PCT/JP2019/047053
§ 371(c)(1), (2) Date Apr. 12, 2021,
PCT Pub. No. WO2020/149033, PCT Pub. Date Jul. 23, 2020.
Claims priority of application No. 2019-006630 (JP), filed on Jan. 18, 2019.
Prior Publication US 2021/0389337 A1, Dec. 16, 2021
Int. Cl. G01N 33/53 (2006.01); G01N 35/00 (2006.01); G01N 35/02 (2006.01)
CPC G01N 35/0092 (2013.01) [G01N 33/5302 (2013.01); G01N 35/02 (2013.01)] 6 Claims
OG exemplary drawing
 
1. An automatic analyze system which analyzes a specimen, comprising:
at least two automatic analyze devices operating in conjunction and which are individually connected to two or more transport devices and analyze measurement items which are different from each other;
a transport device which supplies the specimen to the at least two automatic analyze devices, the transport device including a transport line and specimen rack waiting disk; and
a processor, a memory, and a storage in communication with the at least two automatic analyze devices and the transport device,
wherein the automatic analyze system further includes:
an incubator which is equipped with a plurality of reaction containers which hold reaction solution obtained by mixing and reacting the specimen with a reagent;
a detection circuit which measures a physical property of the reaction solution; and
a planning circuit which determines an order of a measurement of the specimen requested to be executed on the detection circuit,
the measurement in the detection circuit includes items with different measurement times,
the planning circuit provides at least one free cycle after the measurement of at least a predetermined number of times which is at least two, when continuously measuring an item of a sequence with the longest measurement time for at least the predetermined number of times,
the specimen is preferentially transported to a one of the at least two automatic analyze devices with a light load obtained by multiplying measurement time by a number of measurement items among the two or more sets of the automatic analyze devices, and
when the measurement item in the plurality of automatic analyze devices on the same specimen is requested, a waiting time is long at a dispensing position in the automatic analyze device on the side with the light load, and when dispensing in the other automatic analyze device of the same specimen is delayed, the specimen is transported to the other automatic analyze device first regardless of the load.