US 12,085,477 B2
Device and method for measuring emissions with a linear arrangement of sensors
David W. Miller, Clarence Center, NY (US); John William Hynd, Clarence Center, NY (US); Gurdas S. Sandhu, Cary, NC (US); Andrew D. Burnette, El Dorado Hills, CA (US); and Karl Ropkins, Ilkley (GB)
Assigned to 3DATX Corporation, Buffalo, NY (US)
Filed by 3DATX Corporation, Buffalo, NY (US)
Filed on Feb. 13, 2023, as Appl. No. 18/109,244.
Application 18/109,244 is a continuation of application No. 17/128,389, filed on Dec. 21, 2020, granted, now 11,579,045.
Application 17/128,389 is a continuation of application No. 16/220,835, filed on Dec. 14, 2018, granted, now 10,871,420, issued on Dec. 22, 2020.
Application 16/220,835 is a continuation of application No. 15/512,266, granted, now 10,190,945, issued on Jan. 29, 2019, previously published as PCT/US2015/050950, filed on Sep. 18, 2015.
Claims priority of provisional application 62/052,525, filed on Sep. 19, 2014.
Prior Publication US 2023/0204460 A1, Jun. 29, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G01M 15/10 (2006.01); G01N 15/00 (2006.01); G01N 15/02 (2006.01); G01N 15/06 (2006.01)
CPC G01M 15/102 (2013.01) [G01N 15/00 (2013.01); G01N 15/02 (2013.01); G01N 15/0656 (2013.01); G01N 2015/0046 (2013.01)] 16 Claims
OG exemplary drawing
 
1. An emissions measurement system comprising:
an emissions sample inlet;
at least three sample chambers sequentially connected in a linear arrangement, wherein one of the sample chambers is connected to the emissions sample inlet;
at least three sensors, wherein each the sample chambers has one of the sensors, wherein each of the sensors is configured to perform a different measurement of an emissions sample, and wherein the sensors comprise a laser light opacity sensor, a light scattering sensor, and a particle ionization sensor;
an emissions sample outlet connected to one of the sample chambers; and
a pump configured to transport the sample through the sample chambers.