US 12,413,218 B2
Offset detection
Martin Kollerud, Trondheim (NO); and Kyrre Gonsholt, Trondheim (NO)
Assigned to Nordic Semiconductor ASA, Trondheim (NO)
Appl. No. 18/566,562
Filed by Nordic Semiconductor ASA, Trondheim (NO)
PCT Filed May 31, 2022, PCT No. PCT/EP2022/064754
§ 371(c)(1), (2) Date Dec. 1, 2023,
PCT Pub. No. WO2022/253834, PCT Pub. Date Dec. 8, 2022.
Claims priority of application No. 2107951 (GB), filed on Jun. 3, 2021.
Prior Publication US 2024/0259005 A1, Aug. 1, 2024
Int. Cl. H03K 5/156 (2006.01); H03K 3/037 (2006.01); H03K 5/133 (2014.01)
CPC H03K 5/1565 (2013.01) [H03K 3/037 (2013.01); H03K 5/133 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A circuit portion comprising:
a signal generator, clocked by a clock signal, for generating an alternating logic signal comprising a repeated sequence of alternating logic transitions;
a circuit sub-portion which introduces a delay to the alternating logic signal;
an edge-travel detector, configured to sample the delayed alternating logic signal and to output an edge-travel signal representative of a timing of a logic transition in the alternating logic signal with respect to the clock signal; and
a mask block, configured to:
receive a mask signal representative of a candidate timing or a plurality of candidate timings of the logic transition with respect to the clock signal, wherein the mask signal comprises a plurality of bit positions, each bit position corresponding to a portion of the period of the clock signal;
compare the mask signal with the edge-travel signal to determine whether the timing of the logic transition matches the candidate timing or one of the plurality of candidate timings; and
output a comparison signal that is dependent on whether the timing of the logic transition matches the candidate timing or one of the plurality of candidate timings.