| CPC H01S 5/3409 (2013.01) [H01S 5/18311 (2013.01); H01S 5/18358 (2013.01); H01S 5/309 (2013.01); H01S 5/32366 (2013.01); H01S 5/3407 (2013.01); H01S 5/04252 (2019.08); H01S 5/18305 (2013.01); H01S 2304/02 (2013.01); H01S 2304/04 (2013.01)] | 20 Claims |

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1. A method, comprising:
forming a quantum well (QW) layer using an epitaxial growth process, the epitaxial growth process being performed according to a first growth mode to form the QW layer, the QW layer comprising a first dilute nitride material; and
forming a quantum well barrier (QWB) layer using the epitaxial growth process, the epitaxial growth process being performed according to a second growth mode to form the QWB layer, the QWB layer comprising a second dilute nitride material, wherein at least one of:
a nitrogen flux used in the first growth mode is different from a nitrogen flux used in the second growth mode, or
a gallium flux used in the first growth mode is different from a gallium flux used in the second growth mode.
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