US 12,413,024 B2
Substrate connector
Dong Wan Kim, Anyang-si (KR); Sang Jun Oh, Anyang-si (KR); and Hyun Joo Hwang, Anyang-si (KR)
Assigned to LS MTRON LTD., Anyang-si (KR)
Appl. No. 18/023,992
Filed by LS MTRON LTD., Anyang-si (KR)
PCT Filed Jul. 29, 2021, PCT No. PCT/KR2021/009889
§ 371(c)(1), (2) Date Feb. 28, 2023,
PCT Pub. No. WO2022/045603, PCT Pub. Date Mar. 3, 2022.
Claims priority of application No. 10-2020-0108965 (KR), filed on Aug. 28, 2020; and application No. 10-2021-0095753 (KR), filed on Jul. 21, 2021.
Prior Publication US 2023/0268694 A1, Aug. 24, 2023
Int. Cl. H01R 12/50 (2011.01); H01R 12/71 (2011.01); H01R 13/652 (2006.01); H01R 13/6583 (2011.01)
CPC H01R 13/6583 (2013.01) [H01R 12/716 (2013.01); H01R 13/652 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A substrate connector, comprising:
a plurality of radio frequency (RF) contacts for RF signal transmission;
an insulation unit for supporting the RF contacts;
a plurality of transmission contacts coupled to the insulation unit between a first RF contact and a second RF contact such that the first RF contact of the RF contacts and the second RF contact of the RF contacts are spaced apart from each other in a first axial direction;
a ground housing to which the insulation unit is coupled;
a first ground contact which is coupled to the insulation unit and shields the gap between the first RF contact and the transmission contacts on the basis of the first axial direction; and
a second ground contact which is coupled to the insulation unit and shields the gap between the second RF contact and the transmission contacts on the basis of the first axial direction,
wherein the first RF contact includes a first RF inspection plane with which an inspection instrument is to come in contact,
wherein the second RF contact includes a second inspection plane with which the inspection instrument is to come in contact, and
wherein the first RF inspection plane and the second RF inspection plane are arranged on a plane having the same height.