US 12,411,754 B2
Device performance monitoring system
Guenael Thomas Strutt, San Francisco, CA (US); and Steven Paul Lewis, Los Angeles, CA (US)
Assigned to Elliptic Laboratories ASA, Oslo (NO)
Appl. No. 18/283,542
Filed by Elliptic Laboratories ASA, Oslo (NO)
PCT Filed Mar. 22, 2022, PCT No. PCT/EP2022/057423
§ 371(c)(1), (2) Date Sep. 22, 2023,
PCT Pub. No. WO2022/200309, PCT Pub. Date Sep. 29, 2022.
Claims priority of provisional application 63/165,369, filed on Mar. 24, 2021.
Claims priority of application No. 20210589 (NO), filed on May 11, 2021.
Prior Publication US 2024/0176725 A1, May 30, 2024
Int. Cl. G06F 11/00 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01); G06F 11/3604 (2025.01)
CPC G06F 11/3612 (2013.01) [G06F 11/3006 (2013.01); G06F 11/3447 (2013.01)] 13 Claims
OG exemplary drawing
 
1. A system for improving performance of at least one electronic device, the at least one electronic device comprising at least one sensor and a model defining device reaction in response to data produced by at least one of the at least one sensor, the system comprising:
a model generator configured to analyze the data produced from the at least one sensor and the reactions to the data and register errors in the reactions as compared with intended reactions;
wherein the model generator is configured to adjust the device model by minimizing errors between an actual output of the model and a desired output of the model, based on a set of samples recorded on at least one of the at least one electronic device;
wherein the recorded samples include information related to:
which of a number of predefined states a device is in at the occurrence of the error;
the time of the occurred error; and
the number of errors at at least one of a specified time and state; and
wherein the predefined states are related to transition and include a steady state, a pre-transition state, a transition state, and a post-transitions state.