| CPC G02B 6/02042 (2013.01) [G01B 11/161 (2013.01); G01B 21/042 (2013.01); G01D 5/35303 (2013.01); G01D 5/3538 (2013.01); G01D 5/35393 (2013.01); G02B 6/02 (2013.01)] | 20 Claims |

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1. An interferometric measurement system for measuring an optical shape sensor comprising multiple primary cores in the optical shape sensor and an auxiliary core in the optical shape sensor, the system comprising:
interferometric detection circuitry configured to detect measurement interferometric pattern data associated with each of the multiple primary cores and the auxiliary core; and
data processing circuitry configured to:
determine a shape of the optical shape sensor based on the detected measurement interferometric pattern data for the multiple primary cores,
determine a predicted phase or strain value of the auxiliary core based in part on the detected measurement interferometric pattern data for the multiple primary cores,
determine a measurement-based phase or strain value of the auxiliary core based on the detected measurement interferometric pattern data for the auxiliary core,
determine a difference between the predicted phase or strain value of the auxiliary core and the measurement-based phase or strain value of the auxiliary core, and
detect an error associated with the determined shape of the optical shape sensor based on the difference.
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