US 12,411,172 B2
Test system
Nobuyuki Takita, Nagoya (JP)
Assigned to SINTOKOGIO, LTD., Aichi (JP)
Filed by SINTOKOGIO, LTD., Nagoya (JP)
Filed on Feb. 12, 2024, as Appl. No. 18/438,993.
Claims priority of application No. 2023-054289 (JP), filed on Mar. 29, 2023.
Prior Publication US 2024/0329131 A1, Oct. 3, 2024
Int. Cl. G01R 31/317 (2006.01)
CPC G01R 31/31726 (2013.01) [G01R 31/31724 (2013.01)] 5 Claims
OG exemplary drawing
 
1. A test system, comprising:
a plurality of backplanes; and
an integrated controller, wherein a plurality of units are connected to each of the plurality of backplanes;
the integrated controller controls the plurality of units;
the plurality of units are used in a characteristic test of a device;
the plurality of backplanes being connected to each other in a tree structure, the tree structure is a structure in which, starting from a single root node, a plurality of child nodes are branched successively as a hierarchy deepens;
the plurality of units consist of one primary unit and a plurality of secondary units;
the integrated controller determines, in accordance with a type of the characteristic test, the primary unit that controls the operation of the secondary units from among the plurality of units; and
the secondary unit transmits a signal indicative of a position of the primary unit to the other secondary units.