US 12,411,166 B2
Measurement device for characterizing a device-under-test
Thorsten Lueck, Neuried (DE); and Jan-Patrick Schultheis, Kirchheim (DE)
Assigned to Rohde & Schwarz GmbH & Co. KG, Munich (DE)
Filed by Rohde & Schwarz GmbH & Co. KG, Munich (DE)
Filed on Jul. 17, 2023, as Appl. No. 18/353,231.
Prior Publication US 2025/0027986 A1, Jan. 23, 2025
Int. Cl. G01R 31/28 (2006.01); G01R 27/28 (2006.01); G01R 31/319 (2006.01)
CPC G01R 31/2822 (2013.01) [G01R 27/28 (2013.01); G01R 31/31917 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A measurement device for characterizing a device-under-test, DUT, comprising:
an RF signal generator configured to generate at least two test signals in parallel, wherein the at least two test signals each have a different frequency;
a signal path connecting the RF signal generator to a port of the measurement device, wherein the port is arranged for being connected to the DUT;
the signal path being configured to feed the at least two test signals to the port and to receive at least two response signals of the DUT from the port;
a measurement unit;
a forward coupler being connected to the signal path and adapted to forward at least a part of each of the at least two test signals to the measurement unit; and
a reverse coupler being connected to the signal path and adapted to forward at least a part of each of the at least two response signals to the measurement unit;
the measurement unit being adapted to simultaneously measure the forwarded parts of the at least two test signals and the at least two response signals, each in amplitude and phase.