US 12,411,161 B2
Chamber for measuring performance of antenna, system including the same, and operating method thereof
Ungryeol Lee, Suwon-si (KR); Myeonggeun Kim, Suwon-si (KR); Nohwan Park, Suwon-si (KR); Jongseo Park, Suwon-si (KR); Jaeyup Lee, Suwon-si (KR); and Yungil Choi, Suwon-si (KR)
Assigned to Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Sep. 6, 2022, as Appl. No. 17/903,382.
Application 17/903,382 is a continuation of application No. PCT/KR2022/012820, filed on Aug. 26, 2022.
Claims priority of application No. 10-2021-0123254 (KR), filed on Sep. 15, 2021.
Prior Publication US 2023/0089785 A1, Mar. 23, 2023
Int. Cl. G01R 29/10 (2006.01); G01R 29/08 (2006.01); H04B 17/11 (2015.01); H04B 17/15 (2015.01); H04B 17/21 (2015.01)
CPC G01R 29/0821 (2013.01) [H04B 17/11 (2015.01); H04B 17/21 (2015.01)] 19 Claims
OG exemplary drawing
 
1. An anechoic antenna chamber, comprising:
a holder on which a device under test (DUT) is configured to be mounted;
at least one first antenna configured to radiate a first test signal of a first frequency band;
a second antenna provided at an inner side of the antenna chamber and configured to radiate a second test signal of a second frequency;
at least one driver configured to rotate the DUT; and
a control circuit operatively connected with the at least one first antenna, the second antenna, and the at least one driving part,
wherein the control circuit is configured to:
control the at least one driver to rotate the DUT; and
control the at least one first antenna to radiate the first test signal having an intensity of a specified range and control the second antenna to radiate the second test signal, while rotating the DUT, and
wherein the at least one driver includes:
a first driver configured to rotate at least one mounting part about a first rotary axis; and
a second driver configured to rotate the at least one mounting part about a second rotary axis perpendicular to the first rotary axis.