US 12,411,101 B2
Methods, circuits and systems for obtaining impedance or dielectric measurements of a material under test
Adam D. Blot, Altamont, NY (US); Manfred Geier, Oakland, CA (US); and Andrew J. Westcott, Troy, NY (US)
Assigned to TRANSTECH SYSTEMS, INC., Latham, NY (US)
Filed by TransTech Systems, Inc., Latham, NY (US)
Filed on Apr. 24, 2024, as Appl. No. 18/644,290.
Application 18/644,290 is a continuation of application No. 18/110,014, filed on Feb. 15, 2023, granted, now 11,977,040.
Application 18/110,014 is a continuation of application No. 17/739,255, filed on May 9, 2022, granted, now 11,604,155, issued on Mar. 14, 2023.
Application 17/739,255 is a continuation of application No. 17/229,958, filed on Apr. 14, 2021, abandoned.
Claims priority of provisional application 63/010,791, filed on Apr. 16, 2020.
Prior Publication US 2024/0272105 A1, Aug. 15, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. G01N 33/24 (2006.01); G01N 27/02 (2006.01)
CPC G01N 27/028 (2013.01) 20 Claims
OG exemplary drawing
 
1. A method comprising:
using a measurement system including an electronic circuit to characterize a response signal for detecting physical characteristics of a material under test (MUT), by:
transmitting an excitation signal into the MUT and transmitting a reference signal to a set of magnitude and phase (M/P) detectors;
receiving the response signal from the MUT based on the excitation signal;
comparing a magnitude and phase of the response signal with a corresponding detection range for one of the M/P detectors;
comparing a magnitude and phase of the reference signal with a corresponding detection range for each of two of the M/P detectors; and
adjusting at least one of the excitation signal or the reference signal based on the comparisons.