US 12,081,279 B2
Radio frequency chips having waveform generators for self-testing
Jifeng Geng, San Diego, CA (US); and Hong Kui Yang, San Diego, CA (US)
Assigned to ZEKU TECHNOLOGY (SHANGHAI) CORP., LTD., Shanghai (CN)
Filed by ZEKU TECHNOLOGY (SHANGHAI) CORP., LTD., Shanghai (CN)
Filed on Aug. 1, 2022, as Appl. No. 17/878,289.
Application 17/878,289 is a continuation of application No. PCT/IB2020/060832, filed on Nov. 18, 2020.
Claims priority of provisional application 62/970,336, filed on Feb. 5, 2020.
Prior Publication US 2022/0368434 A1, Nov. 17, 2022
Int. Cl. H04B 17/14 (2015.01); H04B 17/19 (2015.01)
CPC H04B 17/14 (2015.01) [H04B 17/19 (2015.01)] 20 Claims
OG exemplary drawing
 
13. A radio frequency (RF) chip comprising a digital front-end, the digital front-end comprising:
a waveform generator configured to generate at least one M-point inverse fast Fourier transform (IFFT) sample based on a resource block (RB) configuration and a pseudo-random binary sequence (PRBS), where M is a positive integer;
wherein the waveform generator comprises:
N readers, each of the N readers being configured to generate an output IFFT sample based on one of the at least one M-point IFFT sample, wherein each of the generated N output IFFT samples is different from one another, where N is a positive integer;
N frequency shifters, each of the N frequency shifters being configured to shift a central frequency of the output IFFT sample generated by a respective reader of the N readers to separate the central frequencies of the output IFFT samples of the N readers; and
an adder configured to combine the shifted N output IFFT samples to generate an L-point IFFT testing signal, where L is a positive integer greater than M, wherein M×N=L.