US 12,081,168 B2
Electrical pathway intermittent fault detection
Katherine Han, San Jose, CA (US); Jack Stewart, Forest Grove, OR (US); and Hai-Yue Han, San Jose, CA (US)
Assigned to MAXEON SOLAR PTE. LTD., Singapore (SG)
Filed by Maxeon Solar Pte. Ltd., Singapore (SG)
Filed on May 25, 2022, as Appl. No. 17/824,324.
Application 17/824,324 is a continuation of application No. 17/064,057, filed on Oct. 6, 2020, granted, now 11,349,433.
Claims priority of provisional application 62/949,808, filed on Dec. 18, 2019.
Prior Publication US 2022/0286085 A1, Sep. 8, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. H02S 50/10 (2014.01); G01R 31/08 (2020.01); G01R 31/11 (2006.01); H02S 40/34 (2014.01)
CPC H02S 50/10 (2014.12) [G01R 31/086 (2013.01); G01R 31/11 (2013.01); H02S 40/34 (2014.12)] 18 Claims
OG exemplary drawing
 
1. A method of testing an electrical pathway of a photovoltaic laminate comprising:
applying a monitoring voltage in a forward bias direction to a first photovoltaic laminate electrical diode connection between photovoltaic cells and measuring observed voltage at the first photovoltaic laminate electrical diode connection;
applying the monitoring voltage in a reverse bias direction to the first photovoltaic laminate electrical diode connection between the photovoltaic cells and measuring observed voltage at the first photovoltaic laminate electrical diode connection;
when applying a monitoring voltage in the forward bias direction, applying mechanical agitation to the first photovoltaic laminate electrical diode connection at a known frequency; and when applying a monitoring voltage in the reverse bias direction, applying mechanical agitation to the first photovoltaic laminate electrical diode connection at a known frequency; and
comparing measured observed voltage in the forward bias direction with applied voltage in the forward bias direction; and comparing measured observed voltage in the reverse bias direction with applied voltage in the reverse bias direction and, based on each comparison, determining if a diode failure is present at the first photovoltaic laminate electrical diode connection.