CPC H01J 37/32926 (2013.01) [G06F 17/18 (2013.01); G06N 3/048 (2023.01); G06N 7/00 (2013.01); G06N 20/10 (2019.01); H01J 37/24 (2013.01); H01J 37/32 (2013.01); H01J 37/32082 (2013.01); H01J 37/32192 (2013.01); H01J 37/32449 (2013.01); H01J 37/32972 (2013.01); H01J 37/3299 (2013.01); G05B 13/00 (2013.01); G05B 13/04 (2013.01); H01J 2237/1825 (2013.01); H01J 2237/334 (2013.01); H01J 2237/335 (2013.01); H05H 13/005 (2013.01)] | 4 Claims |
1. A plasma processing method comprising:
predicting a state of a plasma processing apparatus having a processing chamber in which a sample is subjected to plasma processing, based on a first soundness index value obtained by analyzing a first data obtained from the plasma processing apparatus using a first algorithm and a second soundness index value obtained by analyzing a second data obtained from the plasma processing apparatus using a second algorithm; and
performing plasma processing of the sample based on the predicted state of the plasma processing apparatus,
wherein the first algorithm is an algorithm in which a first time of the plasma processing is a time in which the state is determined as abnormal by the first soundness index value,
wherein the second algorithm is an algorithm in which a second time of the plasma processing is a time within a range of a third time to a fourth time,
wherein the second time of the plasma processing is a time in which the state is determined as abnormal by the second soundness index value,
wherein the third time is a time obtained by subtracting a predetermined time from the first time, and
wherein the fourth time is a time obtained by adding the predetermined time to the first time.
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