US 12,080,366 B2
Method of error correction code (ECC) decoding and memory system performing the same
Kangseok Lee, Seoul (KR); Geunyeong Yu, Seongnam-si (KR); Seonghyeog Choi, Hwaseong-si (KR); Hongrak Son, Anyang-si (KR); and Youngjun Hwang, Osan-si (KR)
Assigned to Samsung Electronics Co., Ltd., (KR)
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Jun. 30, 2022, as Appl. No. 17/854,638.
Claims priority of application No. 10-2021-0179715 (KR), filed on Dec. 15, 2021.
Prior Publication US 2023/0187011 A1, Jun. 15, 2023
Int. Cl. G11C 29/02 (2006.01); G11C 29/52 (2006.01)
CPC G11C 29/52 (2013.01) [G11C 29/021 (2013.01); G11C 29/022 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A method of error correction code (ECC) decoding of a memory controller that controls a nonvolatile memory device, the method comprising:
reading normal read data from a nonvolatile memory device based on normal read voltages;
performing a first ECC decoding with respect to the normal read data;
setting a flip range based on distribution data indicating degeneration degree of retention characteristics of the nonvolatile memory device;
when the first ECC decoding results in failure, reading flip read data from the nonvolatile memory device based on flip read voltages corresponding to the flip range of a threshold voltage;
generating corrected read data based on the flip read data by inverting error candidate bits included in the flip range among bits of the normal read data; and
performing a second ECC decoding with respect to the corrected read data.