US 12,079,550 B1
Wiener process-based method and device for processing accelerated degradation testing data
Guangze Pan, Guangzhou (CN); Xiaojian Ding, Guangzhou (CN); Bochen Chen, Guangzhou (CN); Dan Li, Guangzhou (CN); Lijun Sun, Guangzhou (CN); Wenwei Liu, Guangzhou (CN); Chengju Dong, Guangzhou (CN); and Guangkuo Guo, Guangzhou (CN)
Assigned to China Electronic Product Reliability and Environmental Testing Research Institute (The Fifth Electronic Research Institute of Ministry of Industry and Information Technology) (CEPREI), (CN)
Filed by China Electronic Product Reliability and Environmental Testing Research Institute (The Fifth Electronic Research Institute of Ministry of Industry and Information Technology) (CEPREI), Guangzhou (CN)
Filed on Feb. 6, 2024, as Appl. No. 18/434,051.
Int. Cl. G06F 30/20 (2020.01)
CPC G06F 30/20 (2020.01) 11 Claims
OG exemplary drawing
 
1. A method for processing accelerated degradation test data based on Wiener process, comprising:
constructing a nonlinear Wiener degradation process based on a target-time conversion model, and determining a product reliability function for the to-be-tested products based on the nonlinear Wiener degradation process; and
testing reliabilities of the to-be-tested products based on the product reliability function, and obtaining product reliability test results of the to-be-tested products to provide information of the to-be-tested product lifespan;
wherein the product reliability test results include a mean time between failures to indicate the to-be-tested products' quality over time and ability to maintain functionality within a specified time period;
wherein the product reliability test result further comprises a first mean time between failures and a second mean time between failures; and
wherein the testing the reliabilities of the to-be-tested products based on the product reliability function, and obtaining the product reliability test results of the to-be-tested products comprises:
testing the reliability of each to-be-tested product under multiple accelerated degradation test stresses based on the product reliability function, and obtaining the first mean time between failures of the to-be-tested product; and obtaining the second mean time between failures of the to-be-tested product under a normal stress based on the first mean time between failures and an acceleration factor corresponding to a target accelerated degradation test stress.