US 12,079,303 B2
Degradation detection system
Yuichi Wakabayashi, Tokyo (JP); Koji Wakimoto, Tokyo (JP); Izumi Otsuka, Tokyo (JP); Chikato Ishitobi, Tokyo (JP); and Takehisa Haraguchi, Tokyo (JP)
Assigned to MITSUBISHI ELECTRIC CORPORATION, Tokyo (JP)
Filed by Mitsubishi Electric Corporation, Tokyo (JP)
Filed on Mar. 26, 2021, as Appl. No. 17/214,274.
Application 17/214,274 is a continuation of application No. PCT/JP2019/034731, filed on Sep. 4, 2019.
Claims priority of application No. 2018-186643 (JP), filed on Oct. 1, 2018.
Prior Publication US 2021/0216609 A1, Jul. 15, 2021
Int. Cl. G06F 17/15 (2006.01); G06F 17/18 (2006.01); G06F 18/2132 (2023.01); G08B 21/18 (2006.01)
CPC G06F 17/18 (2013.01) [G06F 17/15 (2013.01); G06F 18/2132 (2023.01); G08B 21/18 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A degradation detection system comprising processing circuitry that executes control, the processing circuitry
to control to build a normal model of a target device from data of a normal model of another device that is different from the target device and normal training data of the target device, which is operation data of the target device in a normal state, the normal model of the target device being a model of the target device in the normal state, the normal model of the another device being built from normal training data of the another device, which is operation data of the another device in the normal state;
to control to build a degradation determination model of the target device for determining degradation of the target device based on the operation data of the target device from data of the normal model of the target device and data of the degradation determination model of the another device for determining degradation of the another device based on the operation data of the another device, the degradation determination model of the another device being built from the normal training data of the another device and degradation training data of the another device, which is the operation data of the another device in a degradation state;
to control to input the operation data of the target device to the degradation determination model of the target device;
to control to determine degradation of the target device from the degradation determination model of the target device to which the operation data is input; and
to control the target device based on the degradation determination model of the target device.