US 12,079,056 B2
Temperature abnormality detection circuit device
Makoto Katase, Azumino (JP)
Assigned to SEIKO EPSON CORPORATION, Tokyo (JP)
Filed by SEIKO EPSON CORPORATION, Tokyo (JP)
Filed on Oct. 19, 2022, as Appl. No. 17/969,076.
Claims priority of application No. 2021-172193 (JP), filed on Oct. 21, 2021.
Prior Publication US 2023/0130982 A1, Apr. 27, 2023
Int. Cl. G06F 1/00 (2006.01); G06F 1/20 (2006.01); G06F 1/3206 (2019.01)
CPC G06F 1/3206 (2013.01) [G06F 1/206 (2013.01)] 9 Claims
OG exemplary drawing
 
1. A circuit device comprising: a plurality of circuit blocks, each circuit block being provided with at least one temperature sensor; and a control circuit controlling the plurality of circuit blocks, the each circuit block performing first feedback control for itself for temperature abnormality detection, based on a temperature detection value of the at least one temperature sensor provided in the each circuit block, the control circuit performing second feedback control for temperature abnormality detection to the each circuit block of the plurality of circuit blocks, based on the temperature detection value of the at least one temperature sensor.