US 12,078,727 B2
Imaging system and method for material characterization of a sample
Frank Gumbmann, Nuremberg (DE); Benedikt Simper, Munich (DE); Gerhard Hamberger, Griesstaett (DE); Andreas Vonloesecke, Tutzing (DE); and Matthias Beer, Neubiberg (DE)
Assigned to ROHDE & SCHWARZ GMBH & CO. KG, Munich (DE)
Filed by Rohde & Schwarz GmbH & Co. KG, Munich (DE)
Filed on Oct. 8, 2020, as Appl. No. 17/066,185.
Claims priority of application No. 20195911 (EP), filed on Sep. 14, 2020.
Prior Publication US 2022/0082695 A1, Mar. 17, 2022
Int. Cl. G01S 17/89 (2020.01); G01S 7/4863 (2020.01); G01S 17/00 (2020.01); H01Q 1/42 (2006.01)
CPC G01S 17/89 (2013.01) [G01S 7/4863 (2013.01); G01S 17/003 (2013.01); H01Q 1/42 (2013.01)] 13 Claims
OG exemplary drawing
 
1. An imaging system for material characterization of a sample, the imaging system comprising:
at least two imaging arrays configured to form at least one imaging array pair, wherein the imaging system is configured to perform at least one reflection measurement with the aid of at least one imaging array, each of the at least two imaging arrays comprising or being a two-dimensional monostatic or multistatic array,
wherein the imaging system is configured to perform at least one transmission measurement with the aid of the at least one imaging array pair, and
wherein the imaging system is configured to determine material characteristics of the sample on the basis of the at least one reflection measurement and/or the at least one transmission measurement.