US 12,078,679 B2
Flip-flop circuitry
Byoung Gon Kang, Seoul (KR)
Assigned to Samsung Electronics Co., Ltd., (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on Jun. 20, 2023, as Appl. No. 18/338,237.
Application 18/338,237 is a continuation of application No. 17/720,242, filed on Apr. 13, 2022, granted, now 11,726,141.
Claims priority of application No. 10-2021-0076691 (KR), filed on Jun. 14, 2021.
Prior Publication US 2023/0333162 A1, Oct. 19, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. H03K 19/20 (2006.01); G01R 31/3185 (2006.01); G11C 7/10 (2006.01); G11C 7/22 (2006.01); H03K 3/037 (2006.01)
CPC G01R 31/318541 (2013.01) [G11C 7/106 (2013.01); G11C 7/1087 (2013.01); G11C 7/222 (2013.01); H03K 3/0372 (2013.01); H03K 19/20 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A flip-flop circuit, comprising:
a clock generator;
a master latch having a scan path and a data path independent of each other; and
a slave latch,
wherein the scan path performs an operation on an inverted scan enable signal and an inverted scan input signal and outputs a scan path signal according to an output signal of the clock generator, and
the data path includes:
a NAND circuit performing a NAND operation on a clock signal and a first latch signal and outputting a modified clock signal; and
an AOI circuit receiving the inverted scan enable signal, the modified clock signal, and a data signal, performing an AND operation on the inverted scan enable signal, the modified clock signal, and the data signal, performing a NOR operation on the scan path signal and a signal obtained by the AND operation, and outputting a signal obtained by the NOR operation as a first latch signal of the next stage.