US 12,078,676 B1
System and method for device under test (DUT) validation reuse across multiple platforms
Nimalan Siva, San Ramon, CA (US); Pratik Shah, Newark, CA (US); Nikita Goyal, Santa Clara, CA (US); and Ankit Anand, Newark, CA (US)
Assigned to Marvell Asia Pte Ltd, Singapore (SG)
Filed by Marvell Asia Pte Ltd, Singapore (SG)
Filed on Jan. 27, 2023, as Appl. No. 18/102,620.
Claims priority of provisional application 63/406,770, filed on Sep. 15, 2022.
Int. Cl. G01R 31/317 (2006.01); G01R 31/3183 (2006.01); G06N 20/00 (2019.01)
CPC G01R 31/31704 (2013.01) [G01R 31/318357 (2013.01); G06N 20/00 (2019.01)] 29 Claims
OG exemplary drawing
 
18. A method to support device under test (DUT) validation reuse across a plurality of platforms, comprising:
generating an inference profile used for an inference operation of a machine learning (ML) application based on one or more of a set of profile configurations, a set of test parameters, and a set of randomized constraints for the ML application;
accepting and verifying a plurality of math functions statically and/or dynamically to identify one or more DUT issues, wherein the plurality of math functions are specified for implementing the ML application;
building an inference model based on the inference profile and the plurality of verified math functions, wherein the inference model is reused for DUT validation across the plurality of platforms.