CPC G01Q 60/16 (2013.01) [B82B 3/0004 (2013.01); G01Q 70/06 (2013.01); G01Q 70/10 (2013.01); G01Q 70/14 (2013.01); G01Q 80/00 (2013.01); G03F 7/0002 (2013.01); G01Q 70/12 (2013.01)] | 12 Claims |
1. A method of forming a composite tip for a scanning tunneling microscope (“STM”), comprising:
using a nanomanipulator to select a single crystal wide-band-gap semiconductor from an array of formed single crystal wide-band-gap semiconductors epitaxially grown selectively on a crystalline substrate, wherein the single crystal wide-band-gap semiconductor comprises a group III-N nanowire;
preparing an electrically conductive wire to provide a substantially flat end surface that is substantially perpendicular to the wire length direction;
transferring the single crystal wide-band-gap semiconductor from the growth substrate to the substantially flat end surface of the electrically conductive wire; and
affixing the single crystal wide-band-gap semiconductor to the substantially flat end surface of the electrically conductive wire to form the composite tip.
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