US 12,078,649 B2
Connection device and specimen inspection automating system provided with same
Shigeki Yamaguchi, Tokyo (JP); Masashi Endo, Tokyo (JP); and Naoto Tsujimura, Tokyo (JP)
Assigned to HITACHI HIGH-TECH CORPORATION, Tokyo (JP)
Appl. No. 15/734,040
Filed by Hitachi High-Tech Corporation, Tokyo (JP)
PCT Filed May 17, 2019, PCT No. PCT/JP2019/019669
§ 371(c)(1), (2) Date Dec. 1, 2020,
PCT Pub. No. WO2019/235172, PCT Pub. Date Dec. 12, 2019.
Claims priority of application No. 2018-106611 (JP), filed on Jun. 4, 2018.
Prior Publication US 2021/0215730 A1, Jul. 15, 2021
Int. Cl. G01N 35/04 (2006.01); G01N 35/00 (2006.01)
CPC G01N 35/04 (2013.01) [G01N 35/0095 (2013.01)] 8 Claims
OG exemplary drawing
 
1. A connection device comprising:
a specimen carrier transport unit configured to transport a specimen carrier configured to house a specimen; and
a carousel configured to rotate to transport a plurality of specimen carriers carried in from the specimen carrier transport unit, at a predetermined interval, to a specimen collection position where a specimen collection mechanism from an external automatic analysis device is received; and
a specimen carrier lifting-lowering ramp installed in a lower portion of a transport path of the carousel that raises a height of the specimen carrier relative to the carousel at the specimen collection position, wherein
the carousel includes a plurality of specimen carrier holding units that hold the specimen carrier, a specimen clamp mechanism cam, and a specimen clamp that is disposed in each of the plurality of specimen carrier holding units and opens and closes in accordance with rotation of the carousel according to a shape of the specimen clamp mechanism cam, and
the specimen clamp is in an open state at a carry-in position where the specimen carrier is carried in the carousel and clamps the specimen carrier at the specimen collection position.