CPC B24B 49/045 (2013.01) [B24B 9/007 (2013.01); B24B 19/165 (2013.01); G01R 1/06711 (2013.01)] | 16 Claims |
1. A probe sanding fixture comprising:
a base;
a probe adapter including a probe guide defining one or more channels defined therein, the probe adapter coupleable to the base such that the one or more channels are extendable along a first direction; and
a sander tool including a sanding wheel and a gauge pin configured to process one or more probes, each of the one or more probes configured to be positioned in each of the one or more channels, the sander tool coupled to the base such that the sanding wheel and gauge pin of the sander tool are rotatable about a first axis and translatable along a second axis, the first axis extending along the first direction;
wherein the gauge pin extends along the first axis toward the probe adapter from a radial center of the sanding wheel, the gauge pin includes an inverted V-shaped notch on an end of the gauge pin distal from the sanding wheel, the inverted V-shaped notch comprising a radially interior portion and a radially outer portion;
wherein the sanding wheel includes a first lapping film with a first grade, the radially outer portion including a second lapping film with a second grade that is different from the first grade, the radially interior portion including a third lapping film with a third grade that is different from both the first grade and the second grade; and
wherein the second grade is a grinding grade and the third grade is a conditioning grade.
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