CPC A61B 18/1206 (2013.01) [A61B 18/1492 (2013.01); A61B 2018/00178 (2013.01); A61B 2018/00351 (2013.01); A61B 2018/00577 (2013.01); A61B 2018/00642 (2013.01); A61B 2018/00708 (2013.01); A61B 2018/0072 (2013.01); A61B 2018/00767 (2013.01); A61B 2018/087 (2013.01); A61B 2018/126 (2013.01); A61B 2018/1286 (2013.01)] | 53 Claims |
1. A pulsed field ablation system comprising:
an output pulse generation circuit;
a high voltage pulse generation circuit electrically connected to the output pulse generation circuit and configured to deliver a high voltage pulse set to the output pulse generation circuit; and
a controller system communicatively connected to a circuit comprising the high voltage pulse generation circuit and the output pulse generation circuit,
wherein the output pulse generation circuit is configured to generate an output pulse set at least in response to the high voltage pulse set, the output pulse set deliverable to a set of selectable electrodes and configured to cause pulsed field ablation of tissue, each pulse in the output pulse set having a rise time that is shorter than a rise time of at least one high voltage pulse in the high voltage pulse set,
wherein the output pulse generation circuit comprises a first capacitor and a second capacitor, the high voltage pulse generation circuit electrically connected to the first capacitor and the second capacitor to deliver at least a first high voltage pulse in the high voltage pulse set to the first capacitor and the second capacitor,
wherein the high voltage pulse generation circuit comprises a first group of switches electrically connected to the first capacitor and the second capacitor, and a second group of switches electrically connected to the first capacitor and the second capacitor,
wherein the high voltage pulse set comprises at least the first high voltage pulse and a second high voltage pulse, and the controller system is configured to cause (a) each switch in the first group of switches to be in a respective NON-OPEN state with each switch in the second group of switches is in a respective OPEN state during a delivery of the first high voltage pulse to the output pulse generation circuit, and (b) each switch in the second group of switches to be in a respective NON-OPEN state with each switch in the first group of switches is in a respective OPEN state during a delivery of the second high voltage pulse to the output pulse generation circuit,
wherein each respective OPEN state for each switch in the first group of switches and for each switch in the second group of switches is configured to prevent flow of electric current through the respective switch, and
wherein each respective NON-OPEN state for each switch in the first group of switches and for each switch in the second group of switches is configured to allow a respective level of electric current to be deliverable through the respective switch, the respective level of electric current deliverable through the respective switch in the respective NON-OPEN state greater than any electric current deliverable through the respective switch in the respective OPEN state.
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