| CPC H10N 60/12 (2023.02) [H10N 60/85 (2023.02)] | 20 Claims |

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1. A device, comprising:
a silicon wafer comprising:
a first doped region formed on a first side of the silicon wafer, wherein the first doped region is superconducting;
a second doped region formed on a second side of the silicon wafer opposite the first side, wherein the second doped region is superconducting; and
a non-doped region layered between the first doped region and the second doped region, wherein the non-doped region acts as a tunnel barrier of a Josephson junction comprising the first doped region, the second doped region, and the non-doped region, wherein a thickness of the non-doped region is defined by a thickness of the silicon wafer and respective depths of the first doped region and the second doped region, and wherein the thickness of the silicon wafer is set by a smart cut process and a polishing process.
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