US 12,408,487 B2
Light-emitting element and display device including same
Jung Hong Min, Yongin-si (KR); Dae Hyun Kim, Yongin-si (KR); Dong Uk Kim, Yongin-si (KR); Hyun Min Cho, Yongin-si (KR); Se Young Kim, Yongin-si (KR); Seung A Lee, Yongin-si (KR); and Hyung Rae Cha, Yongin-si (KR)
Assigned to Samsung Display Co., Ltd., Yongin-si (KR)
Appl. No. 17/310,745
Filed by Samsung Display Co., Ltd., Yongin-si (KR)
PCT Filed Aug. 20, 2019, PCT No. PCT/KR2019/010600
§ 371(c)(1), (2) Date Aug. 20, 2021,
PCT Pub. No. WO2020/171322, PCT Pub. Date Aug. 27, 2020.
Claims priority of application No. 10-2019-0020727 (KR), filed on Feb. 21, 2019.
Prior Publication US 2022/0140186 A1, May 5, 2022
Int. Cl. H10H 20/821 (2025.01); H10H 20/831 (2025.01); H10H 20/857 (2025.01); H10H 29/14 (2025.01)
CPC H10H 20/821 (2025.01) [H10H 20/8312 (2025.01); H10H 20/857 (2025.01); H10H 29/142 (2025.01)] 18 Claims
OG exemplary drawing
 
1. A light emitting element assembly, comprising:
a light emitting element comprising an emission stacked pattern comprising a first semiconductor layer, an active layer, a second semiconductor layer, and an electrode layer that are sequentially stacked in a longitudinal direction of the emission stacked pattern,
an insulating layer on the light emitting element, a width of the insulating layer in the longitudinal direction of the emission stacked pattern is less than or equal to a thickness of the first semiconductor layer in the longitudinal direction of the emission stacked pattern,
wherein the active layer comprises a first surface that is in contact with the first semiconductor layer in the longitudinal direction of the emission stacked pattern, and a second surface that is opposite the first surface and is in contact with the second semiconductor layer,
wherein the first semiconductor layer comprises at least one n-type semiconductor layer, and the second semiconductor layer comprises at least one p-type semiconductor layer,
wherein the first surface of the active layer is located at a point corresponding to −20% to +20% of half of a total length of the emission stacked pattern in the longitudinal direction of the emission stacked pattern,
wherein the electrode layer is thicker than the second semiconductor layer in the longitudinal direction of the emission stacked pattern, and
wherein the electrode layer is thinner than the first semiconductor layer in the longitudinal direction of the emission stacked pattern.