US 12,407,774 B2
Call test system and method thereof
Hui Xu, Suzhou Industrial Park (CN)
Assigned to SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Aug. 25, 2022, as Appl. No. 17/895,721.
Claims priority of application No. 202210593594.6 (CN), filed on May 27, 2022.
Prior Publication US 2023/0412728 A1, Dec. 21, 2023
Int. Cl. H04M 3/26 (2006.01); H04W 24/08 (2009.01)
CPC H04M 3/26 (2013.01) [H04W 24/08 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system comprising:
a signal generating module configured to generate a first calling signal in a first format;
a testing module configured to:
transmit a second calling signal in a second format converted from the first calling signal to a calling terminal,
drive the calling terminal to transmit the second calling signal to a called terminal as a call event,
receive a third called signal in the second format corresponding to the second calling signal from the called terminal, and
convert the third called signal into a resultant called signal in the first format; and
a signal processing module configured to compare the first calling signal with the resultant called signal to determine a call status between the calling terminal and the called terminal.