US 12,407,426 B2
Probes for device testing
Minh-Chau Huynh, San Diego, CA (US)
Assigned to LITEPOINT CORPORATION, San Jose, CA (US)
Filed by LitePoint Corporation, San Jose, CA (US)
Filed on May 12, 2022, as Appl. No. 17/743,218.
Prior Publication US 2023/0370174 A1, Nov. 16, 2023
Int. Cl. H04B 17/10 (2015.01); H04B 7/0413 (2017.01); H04B 17/14 (2015.01); H04B 17/318 (2015.01)
CPC H04B 17/102 (2015.01) [H04B 7/0413 (2013.01); H04B 17/14 (2015.01); H04B 17/318 (2015.01)] 32 Claims
OG exemplary drawing
 
1. A system for testing a device, the device comprising a multiple-input multiple-output (MIMO) wireless device comprising antennas, the antennas comprising at least two antennas for receiving or transmitting, the system comprising:
a test instrument electrically connected to a signal feed line comprised of (i) an inner conductor, (ii) an outer conductor, and (iii) a dielectric material between the inner conductor and the outer conductor; and
probes having wired connections to the test instrument over which signals are communicated between the probes and the test instrument, a probe of the probes being configured to communicate signals with an antenna of the antennas on the device wirelessly in a reactive near-field region of the antenna, the probe comprising:
a first arm configured for placement adjacent to at least part of the antenna to communicate the signals with the antenna wirelessly, the first arm being configured for electrical connection to the inner conductor of the signal feed line; and
a second arm physically away from the first arm, the signal feed line connecting to the second arm such that the outer conductor of the signal feed line is electrically connected to the second arm.