US 12,407,314 B2
Compensation method for characteristic difference of photoelectric element
Kuei-Chung Chang, Taipei (TW)
Assigned to Teco Image Systems Co., Ltd., Taipei (TW)
Filed by Teco Image Systems Co., Ltd., Taipei (TW)
Filed on Dec. 13, 2022, as Appl. No. 18/080,179.
Claims priority of application No. 111145707 (TW), filed on Nov. 29, 2022.
Prior Publication US 2024/0178809 A1, May 30, 2024
Int. Cl. H03G 3/00 (2006.01); H03G 3/30 (2006.01)
CPC H03G 3/007 (2013.01) [H03G 3/3015 (2013.01); H03G 2201/506 (2013.01); H03G 2201/508 (2013.01)] 6 Claims
OG exemplary drawing
 
1. A compensation method for a characteristic difference of a photoelectric element, comprising:
(S1) providing a test substrate, wherein the test substrate comprises a connector, the photoelectric element and a plurality of gain units, wherein the photoelectric element is electrically connected with the connector, the connector comprises a first pin, a second pin, a third pin and a fourth pin, and the plurality of gain units are electrically connected in parallel, wherein each of the plurality of gain units is electrically connected between the second pin and the third pin, and comprises a gain resistor and a disconnection port, wherein the gain resistor is electrically connected to the disconnection port, the disconnection port comprises a first contact and a second contact which are disconnected from each other;
(S2) connecting the connector to a test fixture, wherein the test fixture comprises a test resistor and a test control unit, wherein when the test fixture is connected with the connector, the test resistor is electrically connected between the second pin and the third pin;
(S3) providing input power to the connector from the test fixture so as to generate a test voltage on the photoelectric element by using the input power;
(S4) selecting the corresponding gain unit from the plurality of gain units by the test control unit according to the test voltage and a classification data table; and
(S5) driving a production line to connect the first contact and the second contact of the disconnection port of the selected gain unit by the test control unit so that a conduction is formed between the first contact and the second contact of the selected gain unit;
wherein the plurality of gain units include a first gain unit, a second gain unit, a third gain unit and a fourth gain unit, wherein the first gain unit, the second gain unit, the third gain unit and the fourth gain unit are connected in parallel, wherein the first gain unit comprises a first gain resistor and a first disconnection port, the second gain unit comprises a second gain resistor and a second disconnection port, the third gain unit comprises a third gain resistor and a third disconnection port, and the fourth gain unit comprises a fourth gain resistor and a fourth disconnection port;
wherein the input power is 10 mA, the intensity of an output signal of the photoelectric element is in a range between 0.08 mA and 0.8 mA, the resistance value of the first gain resistor is 3.32 KOhm, the resistance value of the second gain resistor is 6.04 KOhm, and the resistance value of the third gain resistor is 10 KOhm, and the resistance value of the fourth gain resistor is 15 KOhm.